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Orientation-selective X-ray dark field imaging of ordered systems
Revol, V., Kottler, C., Kaufmann, R., Neels, A., Dommann, A.Volume:
112
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4768525
Date:
December, 2012
File:
PDF, 1017 KB
english, 2012