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[IEEE 2016 29th IEEE International System-on-Chip Conference (SOCC) - Seattle, WA, USA (2016.9.6-2016.9.9)] 2016 29th IEEE International System-on-Chip Conference (SOCC) - Sensitivity analysis for SoC performance benchmark against interconnect parasitic resistance and capacitance beyond 10-nm FinFET technology
Ichihashi, Motoi, Zeng, Jia, Zemke, Cole, Lin, Irene, Northrop, Greg, Jin, Ning, Kye, JongwookYear:
2016
Language:
english
DOI:
10.1109/SOCC.2016.7905483
File:
PDF, 2.07 MB
english, 2016