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[IEEE 2016 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Taipei, Taiwan (2016.5.23-2016.5.26)] 2016 IEEE International Instrumentation and Measurement Technology Conference Proceedings - A comparative analysis between genetic algorithms and complex nonlinear least squares on electrical impedance characterization
Janeiro, Fernando M., Ramos, Pedro M.Year:
2016
Language:
english
DOI:
10.1109/i2mtc.2016.7520552
File:
PDF, 539 KB
english, 2016