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Reversible electrochemical modification of the surface of a semiconductor by an atomic-force microscope probe
Kozhukhov, A. S., Sheglov, D. V., Latyshev, A. V.Volume:
51
Language:
english
Journal:
Semiconductors
DOI:
10.1134/S1063782617040091
Date:
April, 2017
File:
PDF, 226 KB
english, 2017