Enhanced Reliability of Top-pinned Perpendicular Magnetic...

Enhanced Reliability of Top-pinned Perpendicular Magnetic Tunnel Junction by Post-oxidation of Sputtered MgO Barrier

Yoshida, Chikako, Noshiro, Hideyuki, Yamazaki, Yuichi, Sugii, Toshihiro
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Volume:
2
Year:
2017
Language:
english
Journal:
MRS Advances
DOI:
10.1557/adv.2017.118
File:
PDF, 440 KB
english, 2017
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