Enhanced Reliability of Top-pinned Perpendicular Magnetic Tunnel Junction by Post-oxidation of Sputtered MgO Barrier
Yoshida, Chikako, Noshiro, Hideyuki, Yamazaki, Yuichi, Sugii, ToshihiroVolume:
2
Year:
2017
Language:
english
Journal:
MRS Advances
DOI:
10.1557/adv.2017.118
File:
PDF, 440 KB
english, 2017