Combination of RBS analysis and infrared vibrational spectroscopy for the characterization of semiconducting β-FeSi2films
Michael Döscher, Günter Oertel, Gerd -Uwe Reinsperger, Burkhardt Selle, Ina Sieber, Ute TroppenzVolume:
125
Year:
1997
Language:
english
Pages:
5
DOI:
10.1007/bf01246193
File:
PDF, 376 KB
english, 1997