[IEEE 2016 23rd International Conference on Pattern...

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[IEEE 2016 23rd International Conference on Pattern Recognition (ICPR) - Cancun, Mexico (2016.12.4-2016.12.8)] 2016 23rd International Conference on Pattern Recognition (ICPR) - HEp-2 specimen classification via deep CNNs and pattern histogram

Hongwei Li,, Hao Huang,, Zheng, Wei-Shi, Xiaohua Xie,, Zhang, Jianguo
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Year:
2016
Language:
english
DOI:
10.1109/ICPR.2016.7899953
File:
PDF, 1.25 MB
english, 2016
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