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Electrical and Interfacial Properties of GaAs MOS Capacitors With La-Doped ZrON as Interfacial Passivation Layer
Lu, Han-Han, Xu, Jing-Ping, Liu, Lu, Lai, Pui-To, Tang, Wing-ManVolume:
64
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2017.2686867
Date:
May, 2017
File:
PDF, 1.19 MB
english, 2017