[IEEE 2016 Progress in Electromagnetic Research Symposium (PIERS) - Shanghai, China (2016.8.8-2016.8.11)] 2016 Progress in Electromagnetic Research Symposium (PIERS) - Application of an adaptive two-wave mixing interferometer for detection of surface defects
Jiachen Ke,, Changqi Duan,, Wei Yi,, Chunsheng Yan,Year:
2016
Language:
english
DOI:
10.1109/piers.2016.7734892
File:
PDF, 749 KB
english, 2016