![](/img/cover-not-exists.png)
[IEEE 2016 IEEE International Reliability Physics Symposium (IRPS) - Pasadena, CA, USA (2016.4.17-2016.4.21)] 2016 IEEE International Reliability Physics Symposium (IRPS) - Optimization of PESD implant design for ESD robustness of 5V drain-back N-LDMOSFET
Chiang, Chun, Chang, Ping-Chen, Tseng, Pei-Shan, Lai, Po-Ya, Tang, Tien-Hao, Su, Kuan-ChengYear:
2016
Language:
english
DOI:
10.1109/irps.2016.7574604
File:
PDF, 462 KB
english, 2016