Relationship between formation of surface-reaction layers...

Relationship between formation of surface-reaction layers and flux of dissociated species in C 4 F 8 /Ar plasma for SiO 2 etching using pulsed-microwave plasma

Matsui, Miyako, Usui, Tatehito, Yasunami, Hisao, Ono, Tetsuo
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Volume:
34
Language:
english
Journal:
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
DOI:
10.1116/1.4961456
Date:
September, 2016
File:
PDF, 1.45 MB
english, 2016
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