Investigation of Graphene Field Effect Transistors with Al 2 O 3 Gate Dielectrics Formed by Metal Oxidation
Jung, Myung-Ho, Handa, Hiroyuki, Takahashi, Ryota, Fukidome, Hirokazu, Suemitsu, Tetsuya, Otsuji, Taiichi, Suemitsu, MakiVolume:
50
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.50.070111
Date:
July, 2011
File:
PDF, 730 KB
english, 2011