Integration and High-Temperature Characterization of Ferroelectric Vanadium-Doped Bismuth Titanate Thin Films on Silicon Carbide
Ekström, Mattias, Khartsev, Sergiy, Östling, Mikael, Zetterling, Carl-MikaelLanguage:
english
Journal:
Journal of Electronic Materials
DOI:
10.1007/s11664-017-5447-3
Date:
March, 2017
File:
PDF, 920 KB
english, 2017