![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE SPIE Defense + Security - Anaheim, California, United States (Sunday 9 April 2017)] Pattern Recognition and Tracking XXVIII - 2-D DOST based local phase pattern for face recognition
Alam, Mohammad S., Moniruzzaman, Md, Alam, Mohammad S.Volume:
10203
Year:
2017
Language:
english
DOI:
10.1117/12.2262806
File:
PDF, 4.60 MB
english, 2017