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Atomic-scale mechanisms of defect induced retention failure in ferroelectrics
Li, Linze, Zhang, Yi, Xie, Lin, Jokisaari, Jacob R., Beekman, Christianne, Yang, Jan-Chi, Chu, Ying-Hao, Christen, Hans M., Pan, XiaoqingLanguage:
english
Journal:
Nano Letters
DOI:
10.1021/acs.nanolett.7b00696
Date:
May, 2017
File:
PDF, 1.85 MB
english, 2017