Advanced Identification and Quantification of In-Bearing Minerals by Scanning Electron Microscope-Based Image Analysis
Bachmann, Kai, Frenzel, Max, Krause, Joachim, Gutzmer, JensLanguage:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927617000460
Date:
May, 2017
File:
PDF, 677 KB
english, 2017