High Thermal Stability AlGaAs/InGaAs Enhancement-Mode pHEMT Using Iridium Buried-Gate Technology
Chiu, Hsien-Chin, Yang, Chih-Wei, Chen, Chao-Hung, Lin, Che-Kai, Wang, Cheng-Shun, Fu, Jeffrey S.Volume:
156
Year:
2009
Language:
english
Journal:
Journal of The Electrochemical Society
DOI:
10.1149/1.3230675
File:
PDF, 385 KB
english, 2009