[IEEE 2017 18th International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2017.3.14-2017.3.15)] 2017 18th International Symposium on Quality Electronic Design (ISQED) - Tunnel FET based ultra-low-leakage compact 2T1C SRAM
Gupta, Navneet, Makosiej, Adam, Vladimirescu, Andrei, Amara, Amara, Anghel, CostinYear:
2017
Language:
english
DOI:
10.1109/ISQED.2017.7918295
File:
PDF, 866 KB
english, 2017