![](/img/cover-not-exists.png)
Abnormal Transconductance Enhancement under Positive Bias Stress in Nanoscale n-Channel Fin Field-Effect-Transistors
Liu, Kuan-Ju, Chang, Ting-Chang, Lin, Chien-Yu, Chen, Ching-En, Tsai, Jyun-Yu, Lu, Ying-Hsin, Liu, Hsi-Wen, Cheng, Osbert, Huang, Cheng-TungVolume:
5
Year:
2016
Language:
english
Journal:
ECS Journal of Solid State Science and Technology
DOI:
10.1149/2.0121606jss
File:
PDF, 900 KB
english, 2016