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[IEEE 2017 18th International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2017.3.14-2017.3.15)] 2017 18th International Symposium on Quality Electronic Design (ISQED) - Integrated circuit identification and true random numbers using 1.5-transistor flash memory
Clark, Lawrence T., Adams, James, Holbert, Keith E.Year:
2017
Language:
english
DOI:
10.1109/ISQED.2017.7918323
File:
PDF, 1.65 MB
english, 2017