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[IEEE 2002 IEEE International SOI Conference - Williamsburg, VA, USA (2002.10.10-2002.10.10)] IEEE International SOI Conference SOI-02 - Measurement and simulation of electrical and thermal property of drain and source on insulator MOSFETs (DSOI)

Ping He,, Xi Lin,, Bo Jiang,, Litian Liu,, Lilin Tian,, Zhijian Li,, Yemin Dong,, Meng Chen,, Xi Wang,
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Year:
2002
Language:
english
DOI:
10.1109/soi.2002.1044414
File:
PDF, 183 KB
english, 2002
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