AIP Conference Proceedings [AIP Publishing LLC BAYESIAN INFERENCE AND MAXIMUM ENTROPY METHODS IN SCIENCE AND ENGINEERING (MAXENT 2014) - Clos Lucé, Amboise, France (21–26 September 2014)] - Non parametric denoising methods based on wavelets: Application to electron microscopy images in low exposure time
Soumia, Sid Ahmed, Messali, Zoubeida, Ouahabi, Abdeldjalil, Trepout, Sylvain, Messaoudi, Cedric, Marco, SergioVolume:
1641
Year:
2015
Language:
english
DOI:
10.1063/1.4906004
File:
PDF, 699 KB
english, 2015