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[Int. Test. Conference IEEE Computer Society International Test Conference (ICSM'99) - Atlantic City, NJ, USA (28-30 Sept. 1999)] International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034) - Testing a system-on-a-chip with embedded microprocessor
Rajsuman, R.Year:
1999
Language:
english
DOI:
10.1109/TEST.1999.805773
File:
PDF, 945 KB
english, 1999