[IEEE 2017 IEEE Workshop on Microelectronics and Electron Devices (WMED) - Boise, ID, USA (2017.4.21-2017.4.21)] 2017 IEEE Workshop on Microelectronics and Electron Devices (WMED) - Development of a scanning tunneling microscope for the carrier profiling of semiconductors by scanning frequency comb microscopy
Spencer, Greg, Hagmann, Mark J.Year:
2017
Language:
english
DOI:
10.1109/WMED.2017.7916926
File:
PDF, 165 KB
english, 2017