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[IEEE 2017 IEEE Workshop on Microelectronics and Electron Devices (WMED) - Boise, ID, USA (2017.4.21-2017.4.21)] 2017 IEEE Workshop on Microelectronics and Electron Devices (WMED) - Simulation of the Frequency Comb Induced by a Periodically Excited Tunnel Junction in Silicon
Zhu, Chen, Andrei, Petru, Hagmann, MarkYear:
2017
Language:
english
DOI:
10.1109/WMED.2017.7916934
File:
PDF, 7.55 MB
english, 2017