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SPIE Proceedings [SPIE Seventh International Conference on Electronics and Information Engineering - Nanjing, China (Saturday 17 September 2016)] Seventh International Conference on Electronics and Information Engineering - Full-waveform associated identification method of ATEM 3D anomalies based on multiple linear regression analysis
Chen, Xiyuan, Ji, Yanju, Huang, Wanyu, Yu, Mingmei, Guan, Shanshan, Wang, Yuan, Zhu, YuVolume:
10322
Year:
2017
Language:
english
DOI:
10.1117/12.2265560
File:
PDF, 426 KB
english, 2017