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[IEEE Conference Publications Design, Automation and Test in Europe - Grenoble, France (2015.03.9-2015.03.13)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015 - A Fast Spatial Variation Modeling Algorithm for Efficient Test Cost Reduction of Analog/RF Circuits
Gonçalves, Hugo, Li, Xin, Correia, Miguel, Tavares, Vitor, Carulli, John, Butler, KennethYear:
2015
Language:
english
DOI:
10.7873/DATE.2015.0690
File:
PDF, 531 KB
english, 2015