Raman characterization of damaged layers of 4H-SiC induced...

AIP Advances 2016 / 01 Vol. 6; Iss. 1

Raman characterization of damaged layers of 4H-SiC induced by scratching

Nakashima, Shin-ichi, Mitani, Takeshi, Tomobe, Masaru, Kato, Tomohisa, Okumura, Hajime
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
6
Language:
english
Journal:
AIP Advances
DOI:
10.1063/1.4939985
Date:
January, 2016
File:
PDF, 2.83 MB
english, 2016
Conversion to is in progress
Conversion to is failed