Software reliability growth models: A comparison of linear and exponential fault content functions for study of imperfect debugging situations
Iqbal, Javaid, Pham, DucVolume:
4
Language:
english
Journal:
Cogent Engineering
DOI:
10.1080/23311916.2017.1286739
Date:
January, 2017
File:
PDF, 493 KB
english, 2017