X-ray Peak Profile Analysis and Microstructural...

Materials Today: Proceedings 2017 Vol. 4; Iss. 2

X-ray Peak Profile Analysis and Microstructural Characterization of Solid State Sintered TiO 2 doped ZnO Ceramics

Vishnu Chittan, M., Mani Kumar, C., Rajesh Kumar, B.
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Volume:
4
Year:
2017
Language:
english
Journal:
Materials Today: Proceedings
DOI:
10.1016/j.matpr.2017.02.168
File:
PDF, 1.08 MB
english, 2017
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