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SPIE Proceedings [SPIE SPIE Defense + Security - Anaheim, California, United States (Sunday 9 April 2017)] Advanced Optics for Defense Applications: UV through LWIR II - UV scale calibration transfer from an improved pyroelectric detector standard to field UV-A meters and 365 nm excitation sources
Vizgaitis, Jay N., Andresen, Bjørn F., Marasco, Peter L., Sanghera, Jasbinder S., Snyder, Miguel P., Eppeldauer, G. P., Podobedov, V. B., Cooksey, C. C.Volume:
10181
Year:
2017
Language:
english
DOI:
10.1117/12.2263093
File:
PDF, 347 KB
english, 2017