Modelling of Short-Circuit-Related Thermal Stress in Aged...

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IEEE Transactions on Industry Applications 2017

Modelling of Short-Circuit-Related Thermal Stress in Aged IGBT Modules

Bahman, Amir Sajjad, Iannuzzo, Francesco, Uhrenfeldt, Christian, Blaabjerg, Frede, Munk-Nielsen, Stig
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Year:
2017
Language:
english
Journal:
IEEE Transactions on Industry Applications
DOI:
10.1109/TIA.2017.2702594
File:
PDF, 1.02 MB
english, 2017
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