The Shear Test as Interface Characterization Tool Applied...

Journal of Electronic Packaging 2009 Vol. 131; Iss. 4

The Shear Test as Interface Characterization Tool Applied to the Si-BCB Interface

Degryse, Dominiek, Vandevelde, Bart, Beyne, Eric, Degrieck, Joris
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Volume:
131
Year:
2009
Language:
english
Journal:
Journal of Electronic Packaging
DOI:
10.1115/1.4000209
File:
PDF, 426 KB
english, 2009
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