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SPIE Proceedings [SPIE SPIE Defense + Security - Anaheim, California, United States (Sunday 9 April 2017)] Passive and Active Millimeter-Wave Imaging XX - Developing an ANSI standard for image quality tools for the testing of active millimeter wave imaging systems
Wikner, David A., Robertson, Duncan A., Barber, Jeffrey, Greca, Joseph, Yam, Kevin, Weatherall, James C., Smith, Peter R., Smith, Barry T.Volume:
10189
Year:
2017
Language:
english
DOI:
10.1117/12.2267194
File:
PDF, 730 KB
english, 2017