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SPIE Proceedings [SPIE SPIE Defense + Security - Anaheim, California, United States (Sunday 9 April 2017)] Passive and Active Millimeter-Wave Imaging XX - Measurements of the dielectric properties of explosives and inert materials at millimeter wave frequencies (V-band and above) using free space reflection methods
Wikner, David A., Robertson, Duncan A., Smith, Peter R., Weatherall, James C., Barber, Jeffrey, Yam, Kevin, Greca, Joseph, Smith, Barry T.Volume:
10189
Year:
2017
Language:
english
DOI:
10.1117/12.2267195
File:
PDF, 699 KB
english, 2017