Hot-Carrier Effects on Total Dose Irradiated 65 nm n-Type...

Chinese Physics Letters 2016 / 07 Vol. 33; Iss. 7

Hot-Carrier Effects on Total Dose Irradiated 65 nm n-Type Metal-Oxide-Semiconductor Field-Effect Transistors

Zheng, Qi-Wen, Cui, Jiang-Wei, Zhou, Hang, Yu, De-Zhao, Yu, Xue-Feng, Guo, Qi
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Volume:
33
Language:
english
Journal:
Chinese Physics Letters
DOI:
10.1088/0256-307X/33/7/076102
Date:
July, 2016
File:
PDF, 415 KB
english, 2016
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