Effects of negative bias stress on trapping properties of...

Microelectronic Engineering 2017 / 06 Vol. 178

Effects of negative bias stress on trapping properties of AlGaN/GaN Schottky barrier diodes

Ferrandis, Philippe, Charles, Matthew, Gillot, Charlotte, Escoffier, René, Morvan, Erwan, Torres, Alphonse, Reimbold, Gilles
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
178
Language:
english
Journal:
Microelectronic Engineering
DOI:
10.1016/j.mee.2017.05.022
Date:
June, 2017
File:
PDF, 942 KB
english, 2017
Conversion to is in progress
Conversion to is failed