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Measuring notch toughness of thin film metallic glasses using focused ion beam-based microcantilever method: Comparison with Ti and TiN crystalline films
Li, Chia-Lin, Chu, Jinn P., Lee, Jyh-WeiVolume:
698
Language:
english
Journal:
Materials Science and Engineering: A
DOI:
10.1016/j.msea.2017.05.002
Date:
June, 2017
File:
PDF, 1.32 MB
english, 2017