Influence of surface relaxation of strained layers on atomic resolution ADF imaging
Beyer, Andreas, Duschek, Lennart, Belz, Jürgen, Oelerich, Jan Oliver, Jandieri, Kakhaber, Volz, KerstinVolume:
181
Language:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2017.04.019
Date:
October, 2017
File:
PDF, 2.11 MB
english, 2017