[IEEE 2017 14th International Conference The Experience of...

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[IEEE 2017 14th International Conference The Experience of Designing and Application of CAD Systems in Microelectronics (CADSM) - Lviv - Polyana, Ukraine (2017.2.21-2017.2.25)] 2017 14th International Conference The Experience of Designing and Application of CAD Systems in Microelectronics (CADSM) - Analysis of SPICE models for SiC MOSFET power devices

Stefanskyi, Andrii, Starzak, Lukasz, Napieralski, Andrzej, Lobur, Mykhaylo
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Year:
2017
Language:
english
DOI:
10.1109/CADSM.2017.7916089
File:
PDF, 318 KB
english, 2017
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