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[IEEE 2017 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus) - St. Petersburg and Moscow, Russia (2017.2.1-2017.2.3)] 2017 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus) - Influence of technology conditions on the surface energy of porous silicon using the method of contact angle
Pastukhov, Andrei I., Belorus, Anton O., Bukina, Yaroslava V., Spivak, Yulia M., Moshnikov, Vyacheslav A.Year:
2017
Language:
english
DOI:
10.1109/EIConRus.2017.7910770
File:
PDF, 299 KB
english, 2017