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SPIE Proceedings [SPIE SPIE Defense + Security - Anaheim, California, United States (Sunday 9 April 2017)] Pattern Recognition and Tracking XXVIII - Multi-texture local ternary pattern for face recognition
Alam, Mohammad S., Essa, Almabrok, Asari, VijayanVolume:
10203
Year:
2017
Language:
english
DOI:
10.1117/12.2263735
File:
PDF, 679 KB
english, 2017