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SPIE Proceedings [SPIE SPIE Defense + Security - Anaheim, California, United States (Sunday 9 April 2017)] Sensors and Systems for Space Applications X - The analysis of the defects of the view field of the UV image intensifier

Pham, Khanh D., Chen, Genshe, Fu, RongGuo, Wei, YiFang, Yang, Qi, Yang, Xu, Wang, GuiYuan
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Volume:
10196
Year:
2017
Language:
english
DOI:
10.1117/12.2264947
File:
PDF, 393 KB
english, 2017
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