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AIP Conference Proceedings [AIP XXXIII BRAZILIAN WORKSHOP ON NUCLEAR PHYSICS - Campos Do Jordão, SP, (Brazil) (7–11 September 2010)] - Radiation Damage Study on the Electrical Properties of Si Diodes
Pascoalino, Kelly C. S., Gonçalves, Josemary A. C., Tobias, Carmen C. B., Vanin, Vito R.Year:
2011
Language:
english
DOI:
10.1063/1.3608986
File:
PDF, 384 KB
english, 2011