Flux Trapping Analysis in Superconducting Circuits

Flux Trapping Analysis in Superconducting Circuits

Jackman, Kyle, Fourie, Coenrad Johann
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Volume:
27
Language:
english
Journal:
IEEE Transactions on Applied Superconductivity
DOI:
10.1109/tasc.2016.2642590
Date:
June, 2017
File:
PDF, 640 KB
english, 2017
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