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Flux Trapping Analysis in Superconducting Circuits
Jackman, Kyle, Fourie, Coenrad JohannVolume:
27
Language:
english
Journal:
IEEE Transactions on Applied Superconductivity
DOI:
10.1109/tasc.2016.2642590
Date:
June, 2017
File:
PDF, 640 KB
english, 2017