Image segmentation for uranium isotopic analysis by SIMS:...

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 2016 / 05 Vol. 34; Iss. 3

Image segmentation for uranium isotopic analysis by SIMS: Combined adaptive thresholding and marker controlled watershed approach

Willingham, David, Naes, Benjamin E., Heasler, Patrick G., Zimmer, Mindy M., Barrett, Christopher A., Shane Addleman, R.
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Volume:
34
Language:
english
Journal:
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
DOI:
10.1116/1.4940150
Date:
May, 2016
File:
PDF, 1.24 MB
english, 2016
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