SPIE Proceedings [SPIE The International Conference on Quality Control by Artificial Vision 2017 - Tokyo, Japan (Sunday 14 May 2017)] Thirteenth International Conference on Quality Control by Artificial Vision 2017 - Towards next generation 3D cameras
Nagahara, Hajime, Umeda, Kazunori, Yamashita, Atsushi, Gupta, MohitVolume:
10338
Year:
2017
Language:
english
DOI:
10.1117/12.2277465
File:
PDF, 105 KB
english, 2017