Defect density dependent photoluminescence yield and triplet diffusion length in rubrene
Irkhin, Pavel, Biaggio, Ivan, Zimmerling, Tino, Döbeli, Max, Batlogg, BertramVolume:
108
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.4941756
Date:
February, 2016
File:
PDF, 876 KB
english, 2016