![](/img/cover-not-exists.png)
[IEEE Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1985 - Amherst, NY, USA (1985.10.20-1985.10.24)] Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1985 - Trapped charge measurements in extruded dielectric cables using thermal pulse transient current technique
Cooper, David E., Das-Gupta, Dilip K.Year:
1985
Language:
english
DOI:
10.1109/ceidp.1985.7728265
File:
PDF, 654 KB
english, 1985