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SPIE Proceedings [SPIE SPIE Commercial + Scientific Sensing and Imaging - Anaheim, California, United States (Sunday 9 April 2017)] Image Sensing Technologies: Materials, Devices, Systems, and Applications IV - Magnification enhanced multi-aperture system with distorted lens design
Dhar, Nibir K., Dutta, Achyut K., Liu, Yueh-Sheng, Lin, Wei-Ting, Chen, Chun-Ho, Huang, Yi-PaiVolume:
10209
Year:
2017
Language:
english
DOI:
10.1117/12.2262326
File:
PDF, 547 KB
english, 2017